ГОСТ ISO/TS 80004-6-2016. Межгосударственный стандарт. Нанотехнологии. Часть 6. Характеристики нанообъектов и методы их определения. Термины и определения

aerosol

2.12

AES

4.16

AFM

3.5.2

agglomerate

2.10

aggregate

2.11

aspect ratio

3.1.4

atomic force microscopy

3.5.2

atom-probe tomography

4.24

Auger electron

4.15

Auger electron spectroscopy

4.16

BET method

3.6.3

Brunauer - Emmett - Teller Method

3.6.3

centrifugal liquid sedimentation

3.4.2

CLS

3.4.2

condensation particle counter

3.3.1

confocal optical microscopy

3.5.10

Coulter counter

3.4.4

CPC

3.3.1

DCS

3.4.2

DEMC

3.3.2

differential centrifugal sedimentation

3.4.2

differential electrical mobility classifier

3.3.2

differential mobility analysing system

3.3.3

differential scanning calorimetry

DLS

3.2.7

DMAS

3.3.3

DPI

4.29

DSC

5.1.3

dual polarization interferometry

4.29

dynamic light scattering

3.2.7

EBSD

5.2.2

EDS

4.21

EDX

4.21

EELS

4.14

EGA

4.25

electric surface charge density

5.3.5

electrical zone sensing

3.4.4

electrokinetic potential

5.3.4

electron backscatter diffraction

5.2.2

electron energy loss spectroscopy

4.14

electron paramagnetic resonance

4.27

electron spectrometer

4.13

electrophoretic mobility

5.3.2

electrophoretic velocity

5.3.1

energy-dispersive X-ray spectroscopy

4.21

EPR

4.27

equivalent diameter

3.1.5

evolved-gas analysis

Faraday-cup aerosol electrometer

3.3.4

FCAE

3.3.4

FCS

4.7

FFF

3.4.1

field flow fractionation

3.4.1

fluorescence

3.5.12

fluorescence correlation spectroscopy

4.7

fluorescence microscopy

3.5.13

fluorescence spectroscopy

4.5

Fourier transform infrared spectroscopy

4.8

FTIR

4.8

hydrodynamic diameter

3.2.6

ICP-MS

4.22

inductively coupled plasma mass spectrometry

4.22

LEEM

3.5.8

light scattering

3.2.5

localization microscopy

3.5.16

low energy electron microscopy

3.5.8

luminescence

4.2

mass specific surface area

3.6.1

spectroscopy

4.28

nanofibre

2.6

nano-object

2.2

nanoparticle

2.3

nanoparticle tracking analysis

3.2.8

nanoplate

2.4

nanorod

2.5

nanoscale

2.1

nanotube

2.7

near-field scanning optical microscopy

3.5.4

neutron diffraction

3.2.3

NMR spectroscopy

4.26

NSOM

3.5.4

NTA

3.2.8

nuclear magnetic resonance spectroscopy

4.26

optical spectroscopy

4.1

particle

2.9

particle shape

3.1.3

particle size

3.1.1

particle size distribution

3.1.2

particle tracking analysis

3.2.8

PCS

3.2.7

photoluminescence

4.3

photoluminescence spectroscopy

4.4

photon correlation spectroscopy

3.2.7

PL spectroscopy

4.4

PTA

3.2.8

QCM

5.1.1

QELS

3.2.7

quantum dot

2.8

quartz crystal microbalance

5.1.1

quasi-elastic light scattering

3.2.7

radius of gyration

3.2.1

Raman effect

4.9

Raman spectroscopy

4.10

SANS

3.2.2

SAXS

3.2.4

scanning electron microscopy

3.5.5

scanning force microscopy

3.5.2

scanning ion microscopy

3.5.9

scanning near-field optical microscopy

3.5.4

scanning probe microscopy

3.5.1

scanning transmission electron microscopy

3.5.7

scanning tunnelling microscopy

3.5.3

SEC

3.4.3

secondary-ion mass spectrometry

4.23

SEEC microscopy

3.5.11

SEM

3.5.5

SERS

4.11

SFM

3.5.2

shear plane

5.3.3

SIMS

4.23

size-exclusion chromatography

3.4.3

slipping plane

5.3.3

small angle neutron scattering

3.2.2

small angle X-ray scattering

3.2.4

SNOM

3.5.4

SPM

3.5.1

STEM

3.5.7

STM

3.5.3

super-resolution microscopy

3.5.15

surface enhanced ellipsometric contrast microscopy

3.5.11

surface enhanced Raman spectroscopy

4.11

suspension

2.13

TEM

3.5.6

TERS

4.12

TG

5.1.2

thermogravimetry

5.1.2

tip enhanced Raman spectroscopy

4.12

TIRF microscopy

3.5.14

total internal reflection fluorescence microscopy

3.5.14

transmission electron microscopy

3.5.6

ultraviolet photoelectron spectroscopy

4.17

UPS

4.17

UV-Vis spectroscopy

4.6

volume specific surface area

3.6.2

XAS

4.19

XPS

4.18

XRF

4.20

X-ray absorption spectroscopy

4.19

X-ray diffraction

5.2.1

X-ray fluorescence

4.20

X-ray photoelectron spectroscopy

4.18

zeta potential

5.3.4